The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 07, 2025

Filed:

Feb. 23, 2022
Applicant:

The Boeing Company, Chicago, IL (US);

Inventors:

Edwin P. Walker, Kihei, HI (US);

Steven F. Griffin, Kihei, HI (US);

Sudhakar Prasad, Minneapolis, MN (US);

Assignee:

The Boeing Company, Arlington, VA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 27/58 (2006.01); G02B 27/10 (2006.01); G02B 27/30 (2006.01); G06T 7/30 (2017.01); H04N 23/55 (2023.01); H04N 23/56 (2023.01); H04N 23/69 (2023.01); G02B 27/42 (2006.01);
U.S. Cl.
CPC ...
G02B 27/58 (2013.01); G02B 27/1066 (2013.01); G02B 27/30 (2013.01); G06T 7/30 (2017.01); H04N 23/55 (2023.01); H04N 23/56 (2023.01); H04N 23/69 (2023.01); G02B 27/4205 (2013.01);
Abstract

A system and method are provided for super-resolution imaging beyond the Rayleigh spatial resolution limit of an optical system. In the context of a system, first and second pinhole assemblies are configured to be controllably positioned. The first and second pinhole assemblies define respective pinholes and being configured to be backlit. The system also includes a collimating lens configured to collimate at least a portion of the signals passing through the respective pinholes of the first and second pinhole assemblies. The system further includes an amplitude/phase mask configured to provide amplitude and phase modulation to signals received from the collimating lens and an imaging lens configured to focus the signals received from the amplitude/phase mask upon an image plane to permit objects to be separately identified.


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