The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 07, 2025
Filed:
Mar. 10, 2022
Zhejiang Lab, Zhejiang, CN;
Zhejiang University, Zhejiang, CN;
Cuihong Li, Hangzhou, CN;
Zhenhai Fu, Hangzhou, CN;
Jing Jiang, Hangzhou, CN;
Zhiming Chen, Hangzhou, CN;
Yuanyuan Ma, Hangzhou, CN;
Huizhu Hu, Hangzhou, CN;
ZHEJIANG LAB, Hangzhou, CN;
ZHEJIANG UNIVERSITY, Hangzhou, CN;
Abstract
Disclosed is an optical trap calibration apparatus and method based on variation of electric field by optical imaging of a nanoparticle. By means of a direct optical imaging method, a linear nanoparticle equilibrium position displacement under the action of a constant electric field is measured to realize calibration, thereby avoiding the introduction of error signals, and improving the reliability of differential calibration. The specific calibration method and apparatus of the present invention are not only suitable for calibration of electric field quantity, but also suitable for the calibration of other magnetic forces and the like. By means of the accurate calibration of mechanical quantity in the present invention, the development and application of the vacuum optical trap sensing technology can be promoted.