The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 07, 2025
Filed:
Aug. 27, 2018
Applicant:
Nikon Corporation, Tokyo, JP;
Inventors:
Yuki Yoshida, Yokohama, JP;
Fumio Suzuki, Yokohama, JP;
Assignee:
Nikon Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); G02B 13/00 (2006.01); G02B 21/02 (2006.01); G02B 27/00 (2006.01);
U.S. Cl.
CPC ...
G02B 21/0076 (2013.01); G02B 13/0045 (2013.01); G02B 21/0032 (2013.01); G02B 21/02 (2013.01); G02B 27/0031 (2013.01);
Abstract
A scanning optical system (SL) comprises a first lens group (G) having a negative refractive power, a second lens group (G) having a positive refractive power, and a third lens group (G) having a negative refractive power. At least one lens included in any of the first to the third lens groups has a positive refractive power, and satisfies the conditional expression 'νd1>80'. At least one lens included in any of the first to the third lens group has a negative refractive power, and satisfies the conditional expression “νd2<50”. The scanning optical system satisfies the conditional expression “h max≥18.0 [mm]”.