The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 07, 2025
Filed:
Aug. 05, 2020
Ouster, Inc., San Francisco, CA (US);
Angus Pacala, San Francisco, CA (US);
Marvin Shu, San Francisco, CA (US);
Ouster, Inc., San Francisco, CA (US);
Abstract
An optical measurement system may improve the accuracy with which it estimates distances to surrounding objects by upgrading various aspects of its data path. Spatial resolution may be increased by subdividing histogram buckets or integration registers based on spatial location. Saturation at any point in the data path can be detected and used to stop counting photons in individual pixels, which can then be normalized after a measurement is over. Multiple peaks can be detected using recursive or iterative techniques to identify a largest remaining peak at each stage. Instead of iterating through the histogram memory multiple times, a threshold can be pre-calculated based on an estimated ambient noise level, and peaks can be detected in a single pass.