The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 07, 2025

Filed:

Nov. 20, 2020
Applicant:

Koninklijke Philips N.v., Eindhoven, NL;

Inventors:

Elwin De Weerdt, Tilburg, NL;

Nicola Pezzotti, Eindhoven, NL;

Assignee:

Koninklijke Philips N.V., Eindhoven, NL;

Primary Examiner:
Int. Cl.
CPC ...
G06V 10/00 (2022.01); G01R 33/48 (2006.01); G01R 33/483 (2006.01); G01R 33/56 (2006.01); G06N 3/08 (2023.01);
U.S. Cl.
CPC ...
G01R 33/5608 (2013.01); G01R 33/4822 (2013.01); G01R 33/4835 (2013.01); G06N 3/08 (2013.01);
Abstract

The present disclosure relates to a method comprising: providing a trained machine learning model. The trained machine learning model is configured for reconstructing images from input data. The method comprises: receiving () a multidimensional array comprising M dimensional acquired data; determining () a subset of values of at least one K selected dimension of the array; for each value of the subset determining () a M−K dimensional array comprising the acquired data corresponding to the value, resulting in a set of M−1 dimensional arrays; inputting () the set of M−K dimensional arrays to the trained machine learning model, and receive a reconstructed image from the trained machine learning model.


Find Patent Forward Citations

Loading…