The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 07, 2025
Filed:
Sep. 29, 2022
Siemens Healthineers Ag, Forccheim, DE;
Mario Zeller, Erlangen, DE;
Adam Kettinger, Erlangen, DE;
Siemens Healthineers AG, Forchheim, DE;
Abstract
In a method for determining at least one test position for a test measurement to be recorded by means of a magnetic resonance system, a test image is recorded, and at least one test position is selected based on the test image. With methods for the compensation of effects of deviations of gradients actually generated during a readout duration from gradients planned for this readout time duration, the selection of test positions according to the disclosure based on a test image advantageously ensures that the test positions lie in a recording region favorable for the test measurement, e.g. also within an examination object to be examined in the test image. A higher image quality in MR images, which were generated using test measurements carried out at test positions positioned according to the disclosure, can therefore be achieved.