The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 07, 2025
Filed:
Feb. 03, 2023
Vanderbilt University, Nashville, TN (US);
Kevin Harkins, Nashville, TN (US);
Mark D. Does, Nashville, TN (US);
Vanderbilt University, Nashville, TN (US);
Abstract
Accurate measurement of gradient waveform errors can often improve image quality in sequences with time varying readout and excitation waveforms. Self-encoding or offset-slice method sequences are commonly used to measure gradient waveforms. However, the self-encoding method requires a long scan time, while the offset-slice method is often low precision, requiring the thickness of the excited slice to be small compared to the maximal k-space encoded by the test waveform. This disclosure describes a novel hybrid of those methods, referred to as variable-prephasing (VP). Like the offset-slice method, VP uses the change in signal phase from offset-slices to calculate the gradient waveform. Similar to the self-encoding method, repeated acquisitions with a variable amplitude self-encoding gradient mitigates the signal loss due to phase wrapping, which, in-turn, allows thicker slices and greater SNR.