The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 07, 2025

Filed:

May. 31, 2023
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Benjamin Neil Trombley, Hopewell Junction, NY (US);

Chung-Lung K. Shum, Wappingers Falls, NY (US);

Karl Evan Smock Anderson, Poughkeepsie, NY (US);

Bodo Hoppe, Ingersheim, DE;

Erica Stuecheli, Austin, TX (US);

Shiri Moran, Kiryat Tivon, IL;

Patrick James Meaney, Poughkeepsie, NY (US);

Arvind Haran, Liberty Hill, TX (US);

Douglas Balazich, Poughkeepsie, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/317 (2006.01); G01R 31/3181 (2006.01); G01R 31/3185 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31704 (2013.01); G01R 31/31705 (2013.01); G01R 31/31816 (2013.01); G01R 31/318525 (2013.01); G01R 31/318583 (2013.01);
Abstract

Error protection analysis of an integrated circuit includes receiving a design model for the integrated circuit, and a list of error checkers associated with the design model. The design model is traversed from each of the error checkers to group storage cells of the design model into checking groups. The design model is updated to include, for each checking group, a unique group identifier associated with each of the storage cells in the checking group.


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