The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 07, 2025
Filed:
Oct. 04, 2019
International Business Machines Corporation, Armonk, NY (US);
Timothy Lindquist, Rochester, MN (US);
Paul E. Dahlen, Rochester, MN (US);
George R. Zettles, IV, Rochester, MN (US);
Layne A. Berge, Rochester, MN (US);
Kent H. Haselhorst, Byron, MN (US);
Daniel Ramirez, Rochester, MN (US);
Sierra Spring, Rochester, MN (US);
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Abstract
Method, apparatus and computer program product for spur detection in a sampled waveform in a mixed analog/digital system using the magnitude of the frequency response comprising acquiring a sample waveform including a set of discrete uniformly spaced samples from a target system, wherein the sample waveform is a time domain vector; applying FFT transforming the time domain vector into the frequency domain; analyzing the frequency domain response including calculating the magnitude response; and determining whether the sample waveform has spurs including comparing the magnitude response to an average noise floor threshold including determining that the magnitude response having an average noise floor value above the average noise floor threshold has one or more spurs and determining that the magnitude response having an average noise floor value below the average noise floor threshold has no spurs, wherein a spur indicates unaligned data having a delayed bit flip.