The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 07, 2025
Filed:
Jul. 29, 2022
International Business Machines Corporation, Armonk, NY (US);
Kushagra Sinha, Wappingers Falls, NY (US);
Zheng Xu, Wappingers Falls, NY (US);
Yufei Wu, Poughkeepsie, NY (US);
Myra Ahmad, San Jose, CA (US);
Nikhilesh C Sahani, Wappingers Falls, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A testing apparatus and a method for testing an integrated circuit are described. One embodiment of the testing apparatus may comprise a main probe pin configured for electrical testing of a sample, the sample having a terminal pad, and a secondary probe pin configured for contact testing of the main probe pin against the terminal pad. In some embodiments, the testing apparatus may further comprise an indicator circuit electrically connected to the main probe pin and the secondary probe pin. The indicator circuit may output a signal when the main probe pin and the secondary probe pin are in simultaneous electrical engagement with the terminal pad.