The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 07, 2025
Filed:
Jul. 20, 2023
Ultima Genomics, Inc., Newark, CA (US);
Kristopher Barbee, Pleasanton, CA (US);
Nathan Beckett, Oakland, CA (US);
Denis Pristinski, Dublin, CA (US);
Derek Schulte, Los Angeles, CA (US);
Avishai Bartov, Hod-Hasharon, IL;
Jamie Sullivan, Eugene, OR (US);
Dumitru Brinza, Montara, CA (US);
Abizar Lakdawalla, Los Altos Hills, CA (US);
Steven Menchen, Fremont, CA (US);
Gilad Almogy, Palo Alto, CA (US);
Mark Pratt, Bozeman, MT (US);
Ultima Genomics, Inc., Fremont, CA (US);
Abstract
Provided are systems and methods for analyte detection and analysis. A system can comprise an open substrate configured to rotate. The open substrate can comprise an array of immobilized analytes. A solution comprising a plurality of probes may be directed, via centrifugal force, across the array during rotation of the substrate, to couple at least one of the plurality of probes with at least one of the analytes to form a bound probe. A detector can be configured to detect a signal from the bound probe via continuous rotational area scanning of the substrate.