The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 07, 2025

Filed:

Jun. 20, 2019
Applicant:

Siemens Healthcare Diagnostics Inc., Tarrytown, NY (US);

Inventor:

Christian Pudduck, Norfolk, MA (US);

Assignee:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/49 (2006.01); G01N 33/543 (2006.01);
U.S. Cl.
CPC ...
G01N 33/49 (2013.01); G01N 33/54388 (2021.08);
Abstract

A sensor assembly for analysis of physical parameters and chemical constituents of small volume samples of bodily fluids. Disclosed herein is a sensor panel with an upper surface and a lower surface and at least one analyte sensor located on the lower surface. The sensor assembly also includes an optional adhesive layer and a contoured fluid pathway cutout. The upper surface of the adhesive layer is secured to the lower surface of the sensor panel. The sensor assembly also includes a sensor cartridge base with a fluid inlet and outlet and a contoured fluid pathway extending between the inlet and the outlet. The contoured fluid pathway mirrors the shape and span of the contoured fluid pathway cutout of the adhesive layer. As a fluid sample is input at the fluid inlet, the fluid traverses along the fluid pathway in contact with the at least one analyte sensor.


Find Patent Forward Citations

Pudduck, Christian. (2025). Contoured sample path for fluid analyzer (U.S. Patent No. 12188922). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12188922

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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