The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 07, 2025

Filed:

Feb. 11, 2022
Applicant:

Government of the United States of America, As Represented BY the Secretary of Commerce, Gaithersburg, MD (US);

Inventors:

Thinh Quoc Bui, Kensington, MD (US);

Solomon Isaac Woods, Kensington, MD (US);

Weston Leo Tew, Jr., Gaithersburg, MD (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 27/72 (2006.01); G01K 1/02 (2021.01); G01K 7/16 (2006.01);
U.S. Cl.
CPC ...
G01N 27/72 (2013.01); G01K 1/026 (2013.01); G01K 7/16 (2013.01);
Abstract

Embodiments of the present invention relate to a system and method for performing temperature-dependent measurements of a magnetic nanoparticle sample. The system includes high frequency coils and sample temperature tunable assembly to determine the specific relaxation process for magnetic nanoparticle sample using both time and frequency domain techniques. During the temperature-dependent measurements of a magnetic nanoparticle sample, system in accordance with embodiments of the present invention resolve the nanoparticle dynamics using a temperature-tunable dual mode, AC susceptibility and magnetic relaxometry, to cover a broad range of frequencies and time scales. Other operational modes of the invention can drive the nanoparticles with arbitrary waveforms (sinusoidal, sum of sinusoids, or repeated pulses) to elicit and measure tailored response behavior from the magnetic nanoparticle sample.


Find Patent Forward Citations

Bui, Thinh. (2025). System and method for measurment of magnetic nanoparticles (U.S. Patent No. 12188900). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12188900

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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