Adaptive programmable modulation techniques for miniaturized measurement devices

Abstract

Aspects of the present disclosure provide measurement devices and methods for detecting electrical characteristics of devices under test (DUTs), such as semiconductor nanowires. Techniques described herein provide programmable measurement devices that may be implemented in a compact form factor while being able to perform reliable measurements. In some embodiments, measurement devices described herein may be programmed to modulate signals for transmitting to a DUT, and may demodulate signals from the DUTs adaptively using self-programming techniques described herein. Such self-programming may include applying a programmable phase delay to oscillator signals used during demodulation. In some embodiments, such measurement devices may be implemented on a single circuit board, in a single integrated circuit package, or even on a single solid-state semiconductor die. Techniques described herein may enable reliable, inexpensive, and small-scale fluid sample measurement devices.