The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 07, 2025
Filed:
Apr. 13, 2021
Inversa Systems Ltd., Fredericton, CA;
Peter Marc Cabot, Fredericton, CA;
INVERSA SYSTEMS LTD., Fredericton, CA;
Abstract
There is described a method for inspecting a structure across a cover layer covering the structure. The method generally has emitting a high energy photon beam along a photon path extending across said cover layer and leading to a target point within said structure, resulting in scattering along at least first and second scatter paths originating from said target point and extending across said cover layer and away therefrom, said first and second scatter paths forming a respective angle relative to said cover layer and defining an inspection plane comprising at least the target point; simultaneously detecting a first scatter signal incoming from said first scatter path and detecting a second scatter signal incoming from said second scatter path, and generating first and second values indicative therefrom; comparing said first and second values to one another; and inspecting said structure based on said comparing.