The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 07, 2025

Filed:

Mar. 12, 2022
Applicant:

The Government of the United States of America, As Represented BY the Secretary of the Navy, Arlington, VA (US);

Inventors:

Andrew Nicholas, Glenelg, MD (US);

Theodore Finne, Vienna, VA (US);

Charles Brown, Beltsville, MD (US);

Christoph Englert, Springfield, VA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/94 (2006.01); G01N 21/47 (2006.01); G01N 21/88 (2006.01); G01V 8/20 (2006.01);
U.S. Cl.
CPC ...
G01N 21/94 (2013.01); G01N 21/47 (2013.01); G01N 21/8851 (2013.01); G01V 8/20 (2013.01);
Abstract

Methods and systems are provided for foreign object debris monitoring in an environment with a dynamic debris field, such as an environment for operating an aircraft. The debris monitoring technique includes generating a light beam and dispersing it to create a virtual witness plate, which is a two-dimensional sheet of light that covers a detection area. The technique also include detecting scattered light from the virtual witness plate caused by debris passing through it. A debris event may be generated based on the scattered light, indicating the presence of debris in the detection area.


Find Patent Forward Citations

Nicholas, Andrew. (2025). Foreign object debris detection (U.S. Patent No. 12188878). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12188878

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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