The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 07, 2025
Filed:
Dec. 12, 2022
Subaru Corporation, Tokyo, JP;
Yugo Tomita, Tokyo, JP;
Tomoya Yoshida, Tokyo, JP;
Takashi Iizuka, Tokyo, JP;
Kosuke Kawai, Tokyo, JP;
SUBARU CORPORATION, Tokyo, JP;
Abstract
An adhesion interface observation method is adapted to observe a region in vicinity of an adhesion interface following adhesion and curing of an adhesive that is coated on adhered members and adheres the adhered members to each other. The adhesion interface observation method includes: exposing the cured adhesive by removing one of the adhered members; forming an observation region by cutting a predetermined part of the adhesive by a predetermined thickness; obliquely cutting the observation region in an oblique direction that is inclined with respect to a thickness direction of the observation region; and observing, by a surface-enhanced Raman scattering spectroscopy, Raman scattering light generated by applying excitation light to an observation possible region that is positioned on a side, of a part of the observation region having been subjected to the oblique cutting, on which a thickness of the part of the observation region is small.