The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 07, 2025

Filed:

Mar. 21, 2022
Applicant:

Topcon Corporation, Tokyo, JP;

Inventors:

Takeshi Sasaki, Tokyo, JP;

Hideki Morita, Tokyo, JP;

Assignee:

Topcon Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 15/00 (2006.01);
U.S. Cl.
CPC ...
G01C 15/002 (2013.01); G06F 2218/08 (2023.01);
Abstract

A method and apparatus for determining the position of a laser scanner using one or more optical targets, each arranged at a known point. The apparatus includes: a ground control point position obtaining part which obtains information of arrangement positions of multiple optical reflection targets; a laser scanner approximate position data obtaining part which obtains an approximate position of a laser scanner; a laser scanning data obtaining part which obtains data of multiple luminescent points; a processing objective point extracting part which extracts multiple luminescent points having luminance exceeding a specific threshold value; and a laser scanner position calculating part which gives data of the arrangement position of the optical reflection target to each of the extracted multiple luminescent points so as to calculate position of the laser scanner.


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