The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 07, 2025

Filed:

Mar. 22, 2024
Applicant:

Continuus Materials Intellectual Property, Llc, The Woodlands, TX (US);

Inventors:

Victoria L. Wan, Philadelphia, PA (US);

Jack G. Winterowd, Puyallup, WA (US);

Richard Schnarre, Metuchen, NJ (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 7/06 (2006.01);
U.S. Cl.
CPC ...
G01B 7/085 (2013.01);
Abstract

A system includes a displacement-type capacitive sensor probe and at least one processor and at least one memory. The at least one memory stores instructions that, when executed by the at least one processor, cause the at least one processor to calibrate the sensor probe to a known dielectric constant of a first material, send an instruction to the sensor probe to measure a capacitive response of a composite article comprising the first material and a second material, receive the measured capacitive response from the calibrated sensor probe, determine, based on the measured capacitive response, an equivalent thickness of the first material in the composite article, and determine a percentage of the first material in the composite article based on the equivalent thickness of the first material and a thickness of the composite article.


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