The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 07, 2025
Filed:
Jun. 02, 2021
Eos Gmbh Electro Optical Systems, Krailling, DE;
Jan Orend, Starnberg, DE;
EOS GMBH ELECTRO OPTICAL SYSTEMS, Krailling, DE;
Abstract
Disclosed is a method for generating an irradiation control data set for creating control data for a device for additive manufacturing of a number of components in a manufacturing process in which at least one layer of a build material is introduced into a process space and the build material of the layer is selectively solidified to form at least one component layer by irradiating at least one section of the layer using a plurality of irradiation resources, wherein layer data are divided into a plurality of work packages, these work packages are put in an order and an irradiation resource is selected taking into account an execution time determined for the irradiation resource to which one of the work packages is assigned taking into account a specified set of evaluation rules, and this is repeated until to a predetermined termination criterion is reached.