The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 07, 2025

Filed:

Mar. 15, 2024
Applicant:

China University of Geosciences (Wuhan), Wuhan, CN;

Inventors:

Jie Yin, Wuhan, CN;

Zuowei Yin, Wuhan, CN;

Kai Guan, Wuhan, CN;

Jinze Cheng, Wuhan, CN;

Xingyu Chen, Wuhan, CN;

Zheng Li, Wuhan, CN;

Qiao Chen, Wuhan, CN;

Tianye Huang, Wuhan, CN;

Andong Zhu, Wuhan, CN;

Shiyi Zhou, Wuhan, CN;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
B22F 10/80 (2021.01); B22F 10/28 (2021.01); B33Y 50/00 (2015.01);
U.S. Cl.
CPC ...
B22F 10/80 (2021.01); B22F 10/28 (2021.01); B33Y 50/00 (2014.12); B22F 2304/10 (2013.01);
Abstract

The present disclosure provides a method for in-situ monitoring of a full cycle of spatter formation, ejection, and falling in laser additive manufacturing. In a spatter formation stage, a paraxial multiocular high-speed photographing apparatus is used to provide a high temporal-spatial resolution, accurately collect spatial positions of spatters at each sampling time, and reconstruct a motion trajectory of the spatters in three-dimensional (3D) space. In an ejection stage, a coaxial monocular high-speed photographing apparatus is used to provide a long-term high temporal-spatial resolution and accurately collect and count an ejection velocity and angle and a motion trajectory of the spatters, and a photodiode monitors a radiation intensity and changes of the spatters. In a falling stage, a multiocular photographing apparatus is used to provide a high spatial resolution covering an entire powder bed and collect a distribution state of falling spatters.


Find Patent Forward Citations

Loading…