The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 07, 2025
Filed:
Apr. 22, 2022
Applicant:
Siemens Healthineers Ag, Forchheim, DE;
Inventors:
Assignee:
SIEMENS HEALTHINEERS AG, Forchheim, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 6/08 (2006.01); A61B 6/00 (2006.01); A61B 6/03 (2006.01);
U.S. Cl.
CPC ...
A61B 6/547 (2013.01); A61B 6/08 (2013.01); A61B 6/032 (2013.01);
Abstract
In a method for regulating a position of an X-ray focus on the anode of an X-ray source of a scan unit of an X-ray imaging system, a combined actual position of the X-ray focus is determined by a combination of a measured position of the X-ray focus and a model-based position of the X-ray focus, which is determined based on a measured value of a deflection current. On the basis of the combined actual position and a target position, a manipulated variable is determined. On the basis of the determined manipulated variable, a regulation is performed to correct a deviation of the position of the X-ray focus from the target position.