The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 31, 2024

Filed:

Jan. 19, 2023
Applicant:

Sick Ivp Ab, Linköping, SE;

Inventors:

Anders Murhed, Linköping, SE;

Mattias Johannesson, Linköping, SE;

Assignee:

SICK IVP AB, Linköping, SE;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04N 13/254 (2018.01);
U.S. Cl.
CPC ...
H04N 13/254 (2018.05);
Abstract

Method and arrangements for obtaining and associating 2D image data with 3D image data are provided. the image data being based on light triangulation, performed by an imaging system, where a measure object with first light and an image sensor senses reflected first light from a measure object, during a first exposure period resulting in a first image with first intensity peaks occurring at first sensor positions, SP1. The measure object is also illuminated with second light(s) and any reflected second light is sensed from the measure object by the image sensor during third exposure period(s) resulting in one or more third images. For respective first sensor position, SP1, in the first image it is selected a respective third sensor position, SP3, in said one or more third images. It is then obtained 2D image data of respective third sensor position, SP3, in said one or more third images and the obtained 2D image data is associated with the first sensor position, SP1, that the respective third sensor position, SP3, was selected for.


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