The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 31, 2024

Filed:

Oct. 27, 2020
Applicants:

Chengdu Boe Optoelectronics Technology Co., Ltd., Sichuan Province, CN;

Boe Technology Group Co., Ltd., Beijing, CN;

Inventors:

Lu Bai, Beijing, CN;

Pengfei Yu, Beijing, CN;

Yi Zhang, Beijing, CN;

Sen Du, Beijing, CN;

Tingliang Liu, Beijing, CN;

Li Song, Beijing, CN;

Huijuan Yang, Beijing, CN;

Xiaofeng Jiang, Beijing, CN;

Yu Wang, Beijing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G09G 3/00 (2006.01); H10K 59/131 (2023.01);
U.S. Cl.
CPC ...
G09G 3/006 (2013.01); H10K 59/131 (2023.02); G09G 2300/0408 (2013.01); G09G 2300/0426 (2013.01); G09G 2310/0202 (2013.01); G09G 2330/04 (2013.01); G09G 2330/10 (2013.01); G09G 2330/12 (2013.01);
Abstract

A display substrate, a detection method, and a display device. The display substrate includes: a substrate, including a display region and a peripheral region surrounding the display region; multiple subpixels, multiple data lines, arranged in the display region; a first control signal line, a second control signal line, a crack detection line, and at least one data detection line, arranged in the peripheral region, and the crack detection line is provided around the display region; multiple display screen detection units, arranged in the peripheral region, configured to transmit, according to a control signal provided by the first control signal line, a detection signal provided by the at least one data detection line to at least one of the multiple data lines; multiple crack detection units, arranged in the peripheral region.


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