The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 31, 2024

Filed:

Mar. 30, 2023
Applicant:

Samsung Display Co., Ltd., Yongin-si, KR;

Inventors:

Kwang Sae Lee, Asan-si, KR;

Won Kyu Kwak, Seongnam-si, KR;

Ki Myeong Eom, Suwon-si, KR;

Assignee:

SAMSUNG DISPLAY CO., LTD., Yongin-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G09G 3/00 (2006.01); G06F 1/16 (2006.01); G09G 3/3291 (2016.01);
U.S. Cl.
CPC ...
G09G 3/006 (2013.01); G06F 1/1652 (2013.01); G09G 3/3291 (2013.01);
Abstract

A display device includes a display area configured to include a plurality of pixels and a plurality of data lines connected to the pixels. A hole area is disposed within the display area. A hole crack detection line is disposed adjacent to the hole area and surrounds the hole area. The device includes first and second detection lines which include first and second detection transfer lines and first and second detection receiving lines, respectively. A test controller electrically connects the first detection receiving line to a first data line and the second detection receiving line to a second data line. Pixels connected to the first data line that is connected to a first bright-line transistor and pixels connected to the second data line that is connected to a second bright-line transistor are configured to emit light when a crack occurs in the hole crack detection line.


Find Patent Forward Citations

Lee, Kwang. (2024). Display device having a detection line and method for inspection thereof (U.S. Patent No. 12183227). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12183227

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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