The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 31, 2024

Filed:

Jul. 09, 2024
Applicant:

Guangdong University of Technology, Guangzhou, CN;

Inventors:

Jian Gao, Guangzhou, CN;

Junlang Liang, Guangzhou, CN;

Lanyu Zhang, Guangzhou, CN;

Yuheng Luo, Guangzhou, CN;

Zhuojun Zheng, Guangzhou, CN;

Xin Chen, Guangzhou, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 10/00 (2022.01); G06T 7/70 (2017.01); G06T 7/80 (2017.01); G06V 10/10 (2022.01); G06V 10/74 (2022.01); G06V 10/84 (2022.01);
U.S. Cl.
CPC ...
G06V 10/16 (2022.01); G06T 7/70 (2017.01); G06T 7/80 (2017.01); G06V 10/761 (2022.01); G06V 10/85 (2022.01);
Abstract

The present application provides an image stitching method, apparatus and device based on reinforcement learning and a storage medium. The method includes: acquiring initial calibration parameters, collecting a sample image and position information of a motion platform; setting a negative reward function; acquiring a state set and a negative reward value set according to a randomly generated action set, the initial calibration parameters, the position information of the motion platform and the negative reward function to construct a probability kinematics model; constructing a state value function based on an occurrence probability of the state, and acquiring an optimal action by optimizing the state value function; and acquiring optimized calibration parameters through the optimal action and the initial calibration parameters, and carrying out image stitching on corresponding sample images through the optimized calibration parameters. The application solves the technical problem of low image stitching quality in the prior art.


Find Patent Forward Citations

Loading…