The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 31, 2024
Filed:
Feb. 13, 2023
Exo Imaging, Inc., Santa Clara, CA (US);
Roberto Ivan Vega Romero, Edmonton, CA;
Seyed Ehsan Seyed Bolouri, Burnaby, CA;
Amirhosein Forouzandehmoghadam, Vancouver, CA;
Amir Safarpoor Kordbacheh, North Vancouver, CA;
Mahdiar Nekoui, Edmonton, CA;
Masood Dehghan, Edmonton, CA;
Dornoosh Zonoobi, Edmonton, CA;
Exo Imaging, Inc., Santa Clara, CA (US);
Abstract
A method includes obtaining a first frame of a probed region acquired using a first probe device at a first time, and a first set of control parameters used to acquire the first frame. Processing the first frame includes segmenting features from the first frame after first probe-specific effects are reduced in the first frame based on the first set of control parameters. The method includes, when the first frame contains a respective attribute present in a second frame acquired at a time earlier than the first time using a second set of control parameters, displaying information related to differences in the respective attribute in the first frame and the second frame. The second frame is obtained by processing the one or more features segmented from the second frame after one or more second probe-specific effects are reduced in the second frame.