The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 31, 2024

Filed:

May. 03, 2023
Applicant:

Renesas Electronics Corporation, Tokyo, JP;

Inventors:

Hiroshi Yamashita, Tokyo, JP;

Masahiro Ibe, Tokyo, JP;

Kojiro Tanimura, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); H04N 23/56 (2023.01);
U.S. Cl.
CPC ...
G06T 7/001 (2013.01); H04N 23/56 (2023.01); G06T 2207/30148 (2013.01);
Abstract

A visual inspection apparatus includes a stage on which a FCBGA type semiconductor package having a lid is placed, a camera located above the stage, a coaxial illumination device located between the camera and the stage, an oblique illumination device located between the camera and the stage, and a control device. The control device is configured to irradiate the FCBGA type semiconductor package with illumination lights by the coaxial illumination device and the oblique illumination device, capture the FCBGA type semiconductor package by the camera to obtain the captured image, integrate a number of pixels of a predetermined pixel value by a binarization process of the captured image to obtain a determination value, and compare the determination value with a predetermined value to determine a non-defective product or a defective product.


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