The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 31, 2024

Filed:

Dec. 15, 2020
Applicant:

Mitsubishi Electric Corporation, Tokyo, JP;

Inventors:

Naoyuki Tokida, Tokyo, JP;

Atsushi Ito, Tokyo, JP;

Yoshihiro Amamori, Tokyo, JP;

Kosaku Yamagata, Tokyo, JP;

Kazuya Makabe, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G01N 21/956 (2006.01); H04N 1/00 (2006.01); H04N 1/03 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); G01N 21/956 (2013.01); H04N 1/00816 (2013.01); H04N 1/00827 (2013.01); H04N 1/0306 (2013.01); G06T 2207/10024 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/30108 (2013.01);
Abstract

An image-based acceptance learning device () learns a result of determination as to whether a planar object () is acceptable or defective based on at least one of a three-dimensional shape or a color on a surface of the planar object (). The device () includes a surface image receiver () to receive an inputted two-dimensional data being image data of the surface of the planar object (), a determination information receiver () to receive an inputted determination information indicating the result of determination as to whether the planar object () corresponding to the two-dimensional data is acceptable or defective, and a learner () to learn, based on the two-dimensional data and the determination information, a relevant area (R) including the three-dimensional shape or the color on the surface in the two-dimensional data. The relevant area is a basis for the determination information.


Find Patent Forward Citations

Loading…