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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12182721 B1

PDFFull Text
Date of Patent:
Dec. 31, 2024

Filed:

Mar. 25, 2021

Deep learning-based anomaly detection in images

Applicant:

Yissum Research Development Company of the Hebrew University of Jerusalem Ltd., Jerusalem, IL;

Inventors:

Yedid Hoshen, Jerusalem, IL;

Liron Bergman, Jerusalem, IL;

Niv Cohen, Raanana, IL;

Tal Reiss, Netanya, IL;

Assignee:

YISSUM RESEARCH DEVELOPMENT COMPANY OF THE HEBREW UNIVERSITY OF JERUSALEM LTD., Jerusalem, IL;

Attorneys:

The Roy Gross Law Firm, LLC

Roy Gross

Primary Examiner:

Amir Alavi

Int. Cl.
CPC ...
G06V 10/00 (2022.01); G06N 3/088 (2023.01); G06V 10/44 (2022.01); G06V 10/74 (2022.01); G06V 10/762 (2022.01); G06V 10/82 (2022.01);
U.S. Cl.
CPC ...
G06N 3/088 (2013.01); G06V 10/44 (2022.01); G06V 10/761 (2022.01); G06V 10/762 (2022.01); G06V 10/82 (2022.01);
Abstract

A method comprising: receiving, as input, training images, wherein at least a majority of the training images represent normal data instances; receiving, as input, a target image; extracting (i) a set of feature representations from a plurality of image locations within each of the training images, and (ii) target feature representations from a plurality of target image locations within the target image; calculating, with respect to a target image location of the plurality of target image locations in the target image, a distance between (iii) the target feature representation of the target image location, and (iv) a subset from the set of feature representations comprising the k nearest the feature representations to the target feature representation; and determining that the target image location is anomalous, when the calculated distance exceeds a predetermined threshold.

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Quick Actions:

Hoshen, Yedid. (2024). Deep learning-based anomaly detection in images (U.S. Patent No. 12182721). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12182721

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