The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 31, 2024

Filed:

Jan. 20, 2023
Applicant:

Panvia Future Technologies, Inc., Palo Alto, CA (US);

Inventor:

Roger Selly, Palo Alto, CA (US);

Assignee:

Panvia Future Technologies Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/00 (2019.01); G06F 16/21 (2019.01); G06F 16/22 (2019.01); G06F 16/2453 (2019.01); G06F 16/25 (2019.01); G06N 10/20 (2022.01);
U.S. Cl.
CPC ...
G06N 10/20 (2022.01); G06F 16/212 (2019.01); G06F 16/2264 (2019.01); G06F 16/24532 (2019.01); G06F 16/258 (2019.01);
Abstract

A method for searching data includes storing a probe data and a target data expressed in a first orthogonal domain. The target data includes potential probe match data each characterized by the length of the target data. The probe data representation and the target data are transformed into an orthogonal domain. In the orthogonal domain, the target data is encoded with modulation functions to produce a plurality of encoded target data, each of the modulation functions having a position index corresponding to one of the potential probe match data. The plurality of encoded target data is interfered with the probe data in the orthogonal domain and an inverse transform result is obtained. If the inverse transform result exceeds a threshold, information is output indicating a match between the probe data and a corresponding one of the potential probe match data.


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