The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 31, 2024

Filed:

Oct. 20, 2023
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Pin-Yu Chen, Yorktown Heights, NY (US);

Sijia Liu, Cambridge, MA (US);

Lingfei Wu, Yorktown Heights, NY (US);

Chia-Yu Chen, Yorktown Heights, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/57 (2013.01); G06N 3/04 (2023.01); G06N 3/08 (2023.01); G06V 10/764 (2022.01); G06V 10/82 (2022.01);
U.S. Cl.
CPC ...
G06F 21/577 (2013.01); G06N 3/04 (2013.01); G06N 3/08 (2013.01); G06V 10/764 (2022.01); G06V 10/82 (2022.01); G06F 2221/034 (2013.01);
Abstract

An adversarial robustness testing method, system, and computer program product include testing, via an accelerator, a robustness of a black-box system under different access settings, where the testing includes tearing down the robustness testing to a subtask of a predetermined size.


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