The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 31, 2024

Filed:

Mar. 09, 2022
Applicant:

Hcl Technologies Limited, New Delhi, IN;

Inventors:

Harikrishna C Warrier, Bengaluru, IN;

Yogesh Gupta, Noida, IN;

Dhanyamraju S U M Prasad, Hyderabad, IN;

Assignee:

HCL Technologies Limited, New Delhi, IN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 16/2457 (2019.01); G06F 16/25 (2019.01); G06F 30/27 (2020.01);
U.S. Cl.
CPC ...
G06F 16/24578 (2019.01); G06F 16/258 (2019.01); G06F 30/27 (2020.01);
Abstract

The disclosure relates to method and system recommending tuning of parameters to generate a data analytics model. The method includes identifying at a data pre-processing stage a pre-processing subset from an associated set of predefined pre-processing methods for a predefined objective. The method includes identifying at a feature selection stage a feature subset from an associated set of predefined feature selection methods for the predefined objective. The method includes identifying at a model training stage a training subset from an associated set of predefined model training methods for the predefined objective. The method further includes generating a plurality of data analytics tuples and selecting a data analytics tuple from the plurality of data analytics tuples. An output result of the data analytics tuple includes highest ranked results for the predefined objective.


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