The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 31, 2024

Filed:

Jan. 31, 2022
Applicant:

Splunk Inc., San Francisco, CA (US);

Inventors:

Yanpei Chen, Sunnyvale, CA (US);

Archana Ganapathi, Palo Alto, CA (US);

Assignee:

Cisco Technology, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/34 (2006.01); G06N 20/00 (2019.01); G06Q 30/0201 (2023.01);
U.S. Cl.
CPC ...
G06F 11/3438 (2013.01); G06N 20/00 (2019.01); G06Q 30/0201 (2013.01);
Abstract

This document discloses methods and systems for modeling product usage. In one practical application, the systems and methods may be utilized to model product usage based on large volume, machine generated product usage data to optimize product pricing and operations. Specifically, the systems and methods described herein may utilize methods with key components to select the maximum number of dimensions that can be modeled based on the number of data points, use a logarithm kernel function to normalize machine data with long-tailed statistical distributions on different numerical scales, compare a large number of candidate models with different candidate dimensions and different structures, and quantify the amount of change and drift in models over time.


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