The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 31, 2024

Filed:

Mar. 29, 2023
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventors:

Takashi Yonemoto, Minamiashigara, JP;

Yukito Saitoh, Minamiashigara, JP;

Hiroshi Sato, Minamiashigara, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02F 1/29 (2006.01); G02B 5/18 (2006.01); G02B 5/30 (2006.01);
U.S. Cl.
CPC ...
G02F 1/292 (2013.01); G02B 5/1828 (2013.01); G02B 5/1833 (2013.01); G02B 5/3016 (2013.01);
Abstract

Provided is a transmissive liquid crystal diffraction element having a large diffraction angle and a high diffraction efficiency. The transmissive liquid crystal diffraction element includes a plurality of optically-anisotropic layers that are formed of a liquid crystal composition including a liquid crystal compound in a thickness direction, in which the optically-anisotropic layer has a liquid crystal alignment pattern in which a direction of an optical axis derived from the liquid crystal compound changes while continuously rotating in at least one in-plane direction, the one in-plane directions of the plurality of optically-anisotropic layers are parallel to each other, in two optically-anisotropic layers adjacent to each other among the plurality of optically-anisotropic layers, a rotation direction of the optical axis in the liquid crystal alignment pattern of one optically-anisotropic layer and a rotation direction of the optical axis in the liquid crystal alignment pattern of the other optically-anisotropic layer are opposite to each other, in cross-sectional images of the plurality of optically-anisotropic layers obtained by observing cross-sections taken in a thickness direction parallel to the one in-plane direction with a scanning electron microscope, the plurality of optically-anisotropic layers have bright portions and dark portions extending from one surface to another surface, and tilt angles of the dark portions of the plurality of optically-anisotropic layers change in order in the thickness direction.


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