The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 31, 2024
Filed:
Jan. 27, 2020
Applicant:
Leica Microsystems Cms Gmbh, Wetzlar, DE;
Inventor:
Patric Pelzer, Wetzlar, DE;
Assignee:
LEICA MICROSYSTEMS CMS GMBH, Wetzlar, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/36 (2006.01); G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
G02B 21/365 (2013.01); G02B 21/0032 (2013.01); G02B 21/008 (2013.01);
Abstract
A method for image generation by means of a microscope includes: locating a sample to be imaged in an object space of the microscope for the image generation using specified image generation parameters; firstly detecting a movement or an intended movement of the sample; and thereupon automatically changing at least one image generation parameter during the movement of the sample depending on a movement variable.