The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 31, 2024
Filed:
Jun. 09, 2022
Applicant:
Enumerix, Inc., Palo Alto, CA (US);
Inventors:
Janice Lai, Palo Alto, CA (US);
David Stern, Palo Alto, CA (US);
Assignee:
ENUMERIX, INC., Palo Alto, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); G01N 15/1429 (2024.01); G01N 15/1434 (2024.01); G02B 21/26 (2006.01); G01N 15/14 (2006.01); G02B 3/06 (2006.01); G02B 3/08 (2006.01); G02B 27/30 (2006.01);
U.S. Cl.
CPC ...
G02B 21/0032 (2013.01); G01N 15/1429 (2013.01); G01N 15/1434 (2013.01); G02B 21/0036 (2013.01); G02B 21/0076 (2013.01); G02B 21/008 (2013.01); G02B 21/26 (2013.01); G01N 2015/1445 (2013.01); G01N 2015/1497 (2013.01); G02B 3/06 (2013.01); G02B 3/08 (2013.01); G02B 27/30 (2013.01);
Abstract
Disclosed herein are light sheet imaging systems for imaging fluorescent samples. Also disclosed herein are sample holder systems for high throughput light sheet imaging of multiple three-dimensional samples without user intervention. Further disclosed herein are automated image processing methods to identify and quantify fluorescent particles within three-dimensional image sets without user intervention or user bias.