The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 31, 2024

Filed:

May. 09, 2022
Applicant:

Raytheon Company, Waltham, MA (US);

Inventors:

Shuwu Wu, Yorba Linda, CA (US);

Matt Keti, Alta Loma, CA (US);

Andrew J. Thomas, Claremont, CA (US);

Joseph Chang, Irvine, CA (US);

Assignee:

Raytheon Company, Tewksbury, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 19/20 (2010.01); G01S 19/39 (2010.01);
U.S. Cl.
CPC ...
G01S 19/20 (2013.01); G01S 19/393 (2019.08); G01S 19/396 (2019.08);
Abstract

A method for multi-track environmental fault monitoring for aerial platforms includes estimating a normalized squared residual error (NSRE) for each of one or more satellite-receiver tracks over time. The method also includes determining an averaged NSRE for each satellite-receiver track by averaging the NSRE over multiple time windows. The method further includes performing a threshold test on the averaged NSRE to determine a filter state. In addition, the method includes determining whether to apply a scale factor for each satellite-receiver track based on the filter state.


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