The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 31, 2024

Filed:

May. 01, 2024
Applicant:

University of Electronic Science and Technology of China, Chengdu, CN;

Inventors:

Jiang Qian, Chengdu, CN;

Jiayang Wu, Fuzhou, CN;

Haitao Lyu, Huzhou, CN;

Guangcai Sun, Xi'an, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 13/90 (2006.01); G01S 7/295 (2006.01);
U.S. Cl.
CPC ...
G01S 13/9011 (2013.01); G01S 7/2955 (2013.01);
Abstract

Provided are a scattering aperture imaging method and a device, a system and a storage medium. The method mainly includes four steps of scattering point position estimation, azimuth resampling, range compensation and synthetic aperture radar imaging. A phased array radar with a fixed position is used for NLOS imaging, and the radar can control a beam to scan in space, which is equivalent to a scattering aperture moving along a relay surface. Therefore, the method can realize converting NLOS imaging into LOS synthetic aperture radar imaging, which can be suitable for the situation that a relay surface is rough and the relay surface with more complicated surface condition, thus widening the application range of radar NLOS imaging.


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