The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 31, 2024

Filed:

Jun. 25, 2024
Applicant:

SR Technologies, Inc., Sunrise, FL (US);

Inventors:

Mark Passler, Boca Raton, FL (US);

Kyle Patrick Kelly, Palm Beach Gardens, FL (US);

Assignee:

SR Technologies, Inc., Sunrise, FL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 13/76 (2006.01); H04W 56/00 (2009.01); H04W 64/00 (2009.01);
U.S. Cl.
CPC ...
G01S 13/76 (2013.01); H04W 56/0055 (2013.01); H04W 64/00 (2013.01);
Abstract

A method and devices are disclosed for geo-location of wireless local area network (WLAN) devices. According to one aspect, a method for determining a corrected round trip times (RTT) resulting from communication with a WD is provided. The WD is configured with one or two short interframe spacings (SIFS). The method includes performing RTT measurements at successive times. The method includes determining a presence of one or two modes based at least in part on peaks of a kernel density estimation (KDE) surface. The KDE surface is determined from the RTT measurements. When there is only one mode, a corrected RTT is determined based on the RTT measurements and a first SIFS. When there are two modes, a corrected RTT is determined based on the RTT measurements and the first SIFS plus an SIFS offset (Δ), Δ being based at least in part on a difference between the two modes.


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