The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 31, 2024

Filed:

Aug. 11, 2020
Applicant:

General Electric Company;

Inventors:

Shahid Ali, Bengaluru, IN;

Sumitha Mohan, Bengaluru, IN;

Balakrishna Pamulaparthy, Hyderabad, IN;

Assignee:

GE INFRASTRUCTURE TECHNOLOGY LLC, Greenville, SC (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/34 (2020.01); G01M 13/00 (2019.01); G01P 3/44 (2006.01); H02P 23/14 (2006.01); H02P 29/024 (2016.01);
U.S. Cl.
CPC ...
G01R 31/343 (2013.01); G01M 13/00 (2013.01); G01P 3/44 (2013.01); H02P 23/14 (2013.01); H02P 29/024 (2013.01);
Abstract

The present disclosure relates to systems and methods for improved anomaly detection for rotating machines. An example method may include determining a rotational speed of a rotating machine; determining, using a frequency domain transform of a signal, a frequency domain signal; determining, based on the rotational speed, a first frequency band within the frequency domain signal for identifying a fault frequency; determining a fault frequency within the first frequency band; determining, based on the fault frequency, a second frequency band within the first frequency band, wherein the second frequency band includes the fault frequency; determining, based on the second frequency band, a first fault index and a baseline of the first fault index; determining, based on a deviation of a second fault index from the baseline, a fault condition; and providing an alert based on the fault condition.


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