The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 31, 2024
Filed:
Feb. 27, 2023
Huawei Technologies Co., Ltd., Guangdong, CN;
Changming Cui, Shenzhen, CN;
Junlin Huang, Shenzhen, CN;
Yu Huang, Shenzhen, CN;
Haitao Fu, Chengdu, CN;
Huawei Technologies Co., Ltd., Shenzhen, CN;
Abstract
This disclosure provides methods and apparatuses for testing a tested circuit. In an implementation, a chip test circuit transmits input data of a test vector to a data distribution circuit through an input of a test bus, and transmits the input data of the test vector to a scan input channel of a tested circuit through the data distribution circuit. After scanning of the tested circuit ends, output data of the test vector of the scan output channel of the tested circuit is transmitted to an output of the test bus through the data distribution circuit to complete the test of the tested circuit. A dynamic correspondence between the data distribution circuit and the test bus is implemented by configuring a first selector, so that test resources can be dynamically allocated.