The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 31, 2024
Filed:
Mar. 25, 2022
Baker Hughes Holdings Llc, Houston, TX (US);
Daniel Werner, Hurth, DE;
Paul Buschke, Hurth, DE;
Dionys van de Ven, Hurth, DE;
Weiwei Zhang, Bonn, DE;
Baker Hughes Holdings LLC, Houston, TX (US);
Abstract
Systems and methods for improved visualization of non-destructive testing (NDT) measurements are provided. A probe can be employed to acquire NDT measurements of a target. Images of the target can also be captured during testing. The captured images can be analyzed to identify selected objects therein (e.g., the target, the probe, etc.) Graphical user interfaces (GUIs) including the NDT measurements can be further generated for viewing in combination with the target. In one aspect, the GUI can be viewed as a hologram within a display of an augmented reality device when viewing the target. In another aspect, the GUI can be projected upon the target. The GUI can be configured to overlay the NDT measurements at the location where the NDT measurements are acquired. This display of the NDT measurements can help an inspector more easily relate the NDT measurements to the target and improve reporting of the NDT measurements.