The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 31, 2024
Filed:
Mar. 23, 2020
De.tec.tor S.r.l., Turin, IT;
Giuseppe Pitta', Turin, IT;
Vanessa La Rosa, Turin, IT;
DE.TEC.TOR S.R.L., Turin, IT;
Abstract
An apparatus () for carrying out a quality control on industrial production lines (), comprising one or more apparatuses () for the measurement of properties of a product sample (C) of the aforesaid industrial production lines (), which supply respective one or more measurement signals, the apparatus () comprising a processing module configured for processing the one or more measurement signals and obtaining properties of the product sample (C), the quality control being carried out as a function of said properties of the product sample (C), said one or more apparatuses () for the measurement of properties of a product sample (C) comprising: an x-ray fluorescence apparatus () that comprises an x-ray source (), which emits a first x-ray beam (XB, XBC) towards the product sample (C) in a measurement environment, and a particle detector (), which is configured for receiving a second x-ray beam (XBR) scattered by the product sample (C) and generating a first received signal supplied within the set of said respective one or more measurement signals. The apparatus () further comprises an optical-spectroscopy apparatus, preferably operating in the near infrared (), which comprises a radiation source operating in the near infrared (NIR), which emits a first optleal-radiation beam towards a product sample (C), and an optical sensor for receiving a second optleal-radiation beam scattered by the product sample (C) and generating a second received signal supplied within the set of said respective one or more measurement signals.