The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 31, 2024
Filed:
Dec. 13, 2022
The Nottingham Trent University, Nottingham, GB;
Cranfield University, Cranfield, GB;
Paul Evans, Nottingham, GB;
Keith Rogers, Swindon, GB;
The Nottingham Trent University, Nottingham, GB;
Cranfield University, Cranfield, GB;
Abstract
A sample inspection system () includes an X-ray emitter, a collimator () and a first energy resolving detector () arranged along a symmetry axis (). The X-ray emitter generates at least one focused conical shell beam () of X-ray radiation comprised of X-ray photons that propagate through a focal point on the symmetry axis downstream of the X-ray emitter. The collimator () has one or more channels, each channel being adapted to receive diffracted or scattered radiation propagating either along the symmetry axis, or parallel with the symmetry axis, or both along and parallel with the symmetry axis (). Upon incidence of the conical shell beam () onto a sample () the first energy resolving detector () detects radiation diffracted or scattered by the sample () via the collimator ().