The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 31, 2024
Filed:
Sep. 15, 2020
Rapiscan Holdings, Inc., Hawthorne, CA;
James Manalad, St-Laurent, CA;
Philippe Desjeans-Gauthier, St-Laurent, CA;
Simon Archambault, St-Laurent, FR;
William Awad, St-Laurent, FR;
Francois Brillon, St-Laurent, FR;
Rapiscan Holdings, Inc., Hawthorne, CA (US);
Abstract
A method for detecting at least one object of interest in at least one raw data x-ray image includes the steps of emitting an incident x-ray radiation beam through a scanning volume having an object therein, detecting x-ray signals transmitted through at least one of the scanning volume and the object, deriving the at least one raw data x-ray image from the detected x-ray signals, inputting the raw data x-ray image, expressed according to an attenuation scale, into a neural network, for each pixel in the raw data x-ray image, outputting from the neural network a probability value assigned to that pixel, and, classifying each pixel in the raw data x-ray image into a first classification if the probability value associated with the pixel exceeds a predetermined threshold probability value and in a second classification if the probability value associated with the pixel is below the predetermined threshold probability value.