The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 31, 2024
Filed:
Oct. 26, 2023
Applicant:
Idexx Laboratories, Inc., Westbrook, ME (US);
Inventors:
David C. Giroux, Gorham, ME (US);
Nathanael Williams, Effingham, NH (US);
Assignee:
IDEXX Laboratories, Inc., Westbrook, ME (US);
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/956 (2006.01); G01N 35/00 (2006.01);
U.S. Cl.
CPC ...
G01N 21/956 (2013.01); G01N 35/00623 (2013.01); G01N 2035/00673 (2013.01);
Abstract
A method of measuring the degree of Z-axis variability in a chemical reagent test slide, which includes the steps of placing a Z-axis measurement fixture on a surface of a gauge block of an optical measurement system having a camera, mounting the chemical reagent test slide on the Z-axis measurement fixture, and positioning the chemical reagent test slide mounted on the Z-axis measurement fixture in optical communication with the camera.