The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 31, 2024
Filed:
Sep. 09, 2021
Applicant:
Analytical Detection Llc, Mission Viejo, CA (US);
Inventors:
Andrey N Vilkov, Aliso Viejo, CA (US);
Joseph Adam Widjaja, Laguna Hills, CA (US);
Jack Albert Syage, Corona del Mar, CA (US);
Assignee:
ANALYTICAL DETECTION LLC, Mission Viejo, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 1/10 (2006.01); G01N 1/44 (2006.01); G01N 1/02 (2006.01);
U.S. Cl.
CPC ...
G01N 1/44 (2013.01); G01N 1/10 (2013.01); G01N 2001/028 (2013.01); G01N 2001/1056 (2013.01);
Abstract
A system includes a conductive sampling swab including a non-mesh substrate and a thermal desorber including a clamping assembly configured to releasably hold the conductive sampling swab. The clamping assembly is configured to be electrically connected to a voltage or current source, and the thermal desorber is configured to resistively heat the conductive sampling swab to a temperature sufficient to vaporize a sample material disposed on the conductive sampling swab.