The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 31, 2024

Filed:

Aug. 01, 2020
Applicant:

Basf Coatings Gmbh, Münster, DE;

Inventor:

Guido Bischoff, Muenster, DE;

Assignee:

BASF COATINGS GMBH, Muenster, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/46 (2006.01); G01J 3/50 (2006.01);
U.S. Cl.
CPC ...
G01J 3/463 (2013.01); G01J 3/504 (2013.01);
Abstract

Described herein is a computer-implemented method for providing a match metric for matching and adjusting color of a target coating and at least one sample coating, the method including at least the steps of: obtaining, via at least one communications interface, spectral curve(s) of the target coating and spectral curves of the sample coating determined at at least one gloss geometry; producing normalized first derivative values of the normalized spectral curves of the target coating and of the sample coating; producing difference values between the normalized first derivative values of the target coating and of the sample coating; producing a first match metric for the target coating and the sample coating based at least on the difference values produced for the at least one gloss geometry; and producing the match metric based on the first match metric. Also described herein is a respective system.


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