The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 31, 2024
Filed:
Dec. 27, 2021
Beijing Boe Optoelectronics Technology Co., Ltd., Beijing, CN;
Boe Technology Group Co., Ltd., Beijing, CN;
Beijing BOE Optoelectronics Technology Co., Ltd., Beijing, CN;
BOE Technology Group Co., Ltd., Beijing, CN;
Abstract
The present disclosure provides a luminous flux test circuitry, a test method and a display panel. The luminous flux test circuitry includes two test sub-circuitries, a control sub-circuitry and a light-shielding pattern. Each test sub-circuitry includes N photosensitive transistors; an output end of each photosensitive transistor in a first test sub-circuitry is coupled to a first input end of the control sub-circuitry; an output end of each photosensitive transistor in a second test sub-circuitry is coupled to a second input end of the control sub-circuitry; the light-shielding pattern covers the photosensitive transistors in the second test sub-circuitry; at a sampling stage, the photosensitive transistors in each test sub-circuitry are in a reverse bias state; and the control sub-circuitry is configured to determine a luminous flux detected by the photosensitive transistors in the first test sub-circuitry in accordance with a leakage current generated by the photosensitive transistors in each test sub-circuitry.